17.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
decorative parts not likely to become energized shall not be required to be in place.
17.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
be damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while
retaining the representative dielectric stress on the circuit.