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IEC (EN) 61347-2-3 - Year 2004
GB-19510.4-2009
http://www./read.php?tid-65084-keyword-19510.html
Clause 17.1
17 Behaviour of the ballast at end of lamp life
17.1 End of lamp life effects
At the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.
For the test simulating end of lamp life effects, three tests are described:
a) asymmetric pulse test (described in 17.2);
b) asymmetric power dissipation test (described in 17.3);
c) open filament test (described in 17.4).
Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.
NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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